Nano tribology is a study field of interfacial phenomenon in nano scale. The interaction between
two contacting solids during a relative motion from atomic to microscale is important to
understand the friction, wear, adhesion, indentation phenomenon. Now a days it has a plenty
application in micro electro mechanical system (MEMS), nano electro mechanical system
(NEMS), magnetic storage, lubricant manufacturing and many more field. There are few
instruments in the market to study the tribology , they are SFA, STM, AFM,FFM. Out of them
AFM is a powerful tool to study nano mechanics and nano tribology for its versatile nature in
imaging, roughness, nano scale force measurement to manipulation of tiny particle in nanoscale. …show more content…
If we would do the scan in high speed then we have choose low stiffness material but
in case of low speed we should always choose high elastic moduli probe.
Adhesion force measurement: Adhesion force measurement can be done during recording of
the force vs displacement curve. This measurement has to be done in force calibration way. In
the below plot point A indicates that the distance between the tip and the sample is too high,
hence there is no interaction between sample and probe. After that, probe approaching the
sample surface and the distance between the probe and sample is decreases. Probe is now
coming towards sample and its now so close to the surface that is point B. Point C indicates that
probe is in contact with sample surface and the piezo goes beyond that so that the probe
deflected more. C-D indicates that the probe is in contact with surface and how sample starts
deforming by the applied probe force. Region D-E shows that probe is being withdrawn from
sample surface. Region D-F describe that the tip is being retracted. Just before this position …show more content…
High stiffness probe is used to indent on any surface. During indentation
procedure a loading unloading curve will come that will describe the indentation depth amount
of indentation and many more elastic properties of samples. Depends on the sample, probe has to
choose. Generally diamond probe are using to indent very hard surface. The probe radius, half
cone angle, poison ratio of the materials all are required during calculation of young’s modulus.
We can clearly understand by comparing the before and after image of the indentation. After
indentation image will clearly shows the amount of area indented. Generally indentation
geometry cause non perpendicular tip-sample approach which result in significant lateral force
contributions during indentation. The spring constant of the cantilever and its geometry must be
well known to calculate the elastic properties. During nano indentation hardness measurement
the scan size has to be zero. Advantage of AFM indentation is its high depth and load