Scanning Electron Analysis

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The SEM produces a largely magnified image by using electrons instead of light to form an image. A beam of electrons is produced at the top of the microscope by an electron gun. It consists of an electron gun to produce high energy electron beam. A magnetic condensing lens is used to condense the electron beam and a scanning coil is arranged in-between magnetic condensing lens and the sample. The electron detector (Scintillator) is used to collect the secondary electrons and can be converted into electrical signal. These signals can be fed into CRO through video amplifier as shown. In order to produce images the electron beam is focused into a fine probe, which is scanned across the surface of the specimen with the help of scanning coils is shown in Fig. 2.6. Each point on the specimen that is struck by the accelerated electrons emits signal in the form of electromagnetic radiation. Selected portions of this radiation, usually secondary (SE) and/or backscattered electrons (BSE), are collected by a detector and the resulting signal is amplified and displayed on a TV screen or computer monitor. The resulting image is generally straightforward to interpret, at …show more content…
The disadvantages of a Scanning Electron Microscope start with the size and cost. In addition, SEMs are limited to solid, inorganic samples small enough to fit inside the vacuum chamber that can handle moderate vacuum pressure. Finally, SEMs carry a small risk of radiation exposure associated with the electrons that scatter from beneath the sample surface. The sample chamber is designed to prevent any electrical and magnetic interference, which should eliminate the chance of radiation escaping the chamber. Even though the risk is minimal, SEM operators and researchers are advised to observe safety

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